Invention Grant
- Patent Title: Measurement apparatus and measurement method
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Application No.: US17669954Application Date: 2022-02-11
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Publication No.: US11711178B2Publication Date: 2023-07-25
- Inventor: Shotaro Maki , Hidetoshi Suzuki , Lilei Wang
- Applicant: Panasonic Intellectual Property Corporation of America
- Applicant Address: US CA Torrance
- Assignee: PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA
- Current Assignee Address: US CA Torrance
- Agency: Seed IP Law Group LLP
- Main IPC: H04L1/24
- IPC: H04L1/24 ; H04L25/02 ; H04L25/03 ; H04L27/36

Abstract:
An EVM measurement value is appropriately determined while CPE/ICI correction is taken into account. In a measurement apparatus (300), an EVM measurer (305) measures a modulation quality of a signal transmitted from a transmission apparatus. An EVM determiner (306) determines whether or not the measurement value of the modulation quality is equal to or less than a first requirement value, in a case where correction relating to a phase noise of the transmission apparatus is necessary in a reception apparatus. The first requirement value herein is higher than a second requirement value used in the determination of the measurement value in a case where the correction relating to the phase noise of the transmission apparatus is unnecessary in the reception apparatus.
Public/Granted literature
- US20220166565A1 MEASUREMENT APPARATUS AND MEASUREMENT METHOD Public/Granted day:2022-05-26
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