Invention Grant
- Patent Title: Graphene layer for reduced contact resistance
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Application No.: US17403267Application Date: 2021-08-16
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Publication No.: US11721627B2Publication Date: 2023-08-08
- Inventor: Shin-Yi Yang , Ming-Han Lee , Shau-Lin Shue
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L23/532
- IPC: H01L23/532 ; H01L21/768 ; H01L23/528 ; H01L23/522 ; H01L21/321

Abstract:
A method includes forming a trench within a dielectric layer, the trench comprising an interconnect portion and a via portion, the via portion exposing an underlying conductive feature. The method further includes depositing a seed layer within the trench, depositing a carbon layer on the seed layer, performing a carbon dissolution process to cause a graphene layer to form between the seed layer and the underlying conductive feature, and filling a remainder of the trench with a conductive material.
Public/Granted literature
- US20210375777A1 Graphene Layer for Reduced Contact Resistance Public/Granted day:2021-12-02
Information query
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