Invention Grant
- Patent Title: Semiconductor device having an inter-layer via (ILV), and method of making same
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Application No.: US17325708Application Date: 2021-05-20
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Publication No.: US11723195B2Publication Date: 2023-08-08
- Inventor: Tsung-Hsien Huang , Hong-Chen Cheng , Hung-Jen Liao , Cheng Hung Lee
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- The original application number of the division: US16205751 2018.11.30
- Main IPC: H01L27/112
- IPC: H01L27/112 ; G11C7/18 ; H10B20/00 ; H01L23/522 ; H01L21/768 ; H01L23/528 ; H01L27/06

Abstract:
A method of making a semiconductor device includes forming a first memory device, connecting a first word line to the first memory device, forming at least a first via, forming a second memory device, connecting a second word line to the second memory device, connecting a bit line to the first memory device and connecting the bit line to the second memory device by the first via. The first and second memory devices are separated by an inter-layer dielectric, and the first via connects the first memory device and the second memory device.
Public/Granted literature
- US20210272968A1 SEMICONDUCTOR DEVICE HAVING AN INTER-LAYER VIA (ILV), AND METHOD OF MAKING SAME Public/Granted day:2021-09-02
Information query
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