- 专利标题: Integrated cluster tool for selective area deposition
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申请号: US16433064申请日: 2019-06-06
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公开(公告)号: US11725274B2公开(公告)日: 2023-08-15
- 发明人: Tobin Kaufman-Osborn , Srinivas D. Nemani , Ludovic Godet , Qiwei Liang , Adib Khan
- 申请人: Applied Materials, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson + Sheridan, LLP
- 分案原申请号: US15173356 2016.06.03
- 主分类号: C23C16/02
- IPC分类号: C23C16/02 ; C23C16/04 ; H01L21/67 ; H01L21/687 ; C23C16/455 ; C23C16/54 ; C23C16/56 ; H01L21/02 ; H01J37/32 ; H01L21/677 ; H01L21/8234
摘要:
Embodiments described herein relate to apparatus and methods for processing a substrate. In one embodiment, a cluster tool apparatus is provided having a transfer chamber and a pre-clean chamber, a self-assembled monolayer (SAM) deposition chamber, an atomic layer deposition (ALD) chamber, and a post-processing chamber disposed about the transfer chamber. A substrate may be processed by the cluster tool and transferred between the pre-clean chamber, the SAM deposition chamber, the ALD chamber, and the post-processing chamber. Transfer of the substrate between each of the chambers may be facilitated by the transfer chamber which houses a transfer robot.
公开/授权文献
- US20190301009A1 INTEGRATED CLUSTER TOOL FOR SELECTIVE AREA DEPOSITION 公开/授权日:2019-10-03
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