- 专利标题: Sample inspection apparatus employing a diffraction detector
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申请号: US17945434申请日: 2022-09-15
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公开(公告)号: US11726048B2公开(公告)日: 2023-08-15
- 发明人: Paul Evans , Keith Rogers
- 申请人: THE NOTTINGHAM TRENT UNIVERSITY , CRANFIELD UNIVERSITY
- 申请人地址: GB Nottingham
- 专利权人: The Nottingham Trent University,The Cranfield University
- 当前专利权人: The Nottingham Trent University,The Cranfield University
- 当前专利权人地址: GB Nottingham; GB Cranfield
- 代理机构: Ruggiero McAllister & McMahon LLC
- 优先权: GB 03077 2017.02.25 GB 03078 2017.02.25 GB 03079 2017.02.25 GB 03080 2017.02.25
- 分案原申请号: US17180310 2021.02.19
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; G01N23/20008 ; G01N23/205
摘要:
A sample inspection apparatus includes a source of electromagnetic radiation, a beam former for producing a plurality of coaxial and substantially conical shells of radiation, a detection surface and a set of conical shell slot collimators. Each conical shell has a different opening angle. The detection surface is arranged to receive diffracted radiation after incidence of one or more of the conical shells upon the sample to be inspected. The set of conical shell slot collimators is provided at or close to the detection surface which each stare at different annular regions of different corresponding conical shells.
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