Header for an electric component
    1.
    发明授权

    公开(公告)号:US12230937B2

    公开(公告)日:2025-02-18

    申请号:US17461663

    申请日:2021-08-30

    Applicant: SCHOTT AG

    Abstract: A header for electronic components is provided. The header has a base with at least two electrical feedthroughs each having a feedthrough pin extending through the base and being electrically isolated to the base within the feedthrough. The further includes at least one pedestal connected to the base and two submounts. Each submount includes a carrier with a structured conductor plating that has at least two conductor traces with one of the conductor traces of each submount being electrically connected to one of the feedthrough pins. The submounts are equally formed but mounted in different orientations.

    Spherical plain bearing with angular misalignment restraint system, and angular misalignment restrain system

    公开(公告)号:US12196258B2

    公开(公告)日:2025-01-14

    申请号:US17983590

    申请日:2022-11-09

    Abstract: A spherical plain bearing includes an outer ring having a concave interior spherical surface, and an inner member having a convex exterior spherical surface. The inner member is pivotally disposed in the outer ring such that the inner member and the outer ring are angularly misalignable relative to one another. The spherical plain bearing includes an angular misalignment restraint system which includes an inner member restraint feature on the inner member and an outer ring restraint feature on the outer member. The first and second portions are spaced apart when the inner member and the outer ring are angularly misaligned relative to one another by less than a predetermined maximum angle θ, and come into abutment when the inner member and the outer ring are angularly misaligned relative to one another by angle θ. The abutment prevents any further relative angular misalignment of the inner member and the outer ring.

    X-ray system
    10.
    发明授权

    公开(公告)号:US12181427B1

    公开(公告)日:2024-12-31

    申请号:US18722957

    申请日:2022-12-13

    Abstract: A sample inspection system (100) includes an X-ray emitter, a collimator (170) and a first energy resolving detector (180) arranged along a symmetry axis (105). The X-ray emitter generates at least one focused conical shell beam (150) of X-ray radiation comprised of X-ray photons that propagate through a focal point on the symmetry axis downstream of the X-ray emitter. The collimator (170) has one or more channels, each channel being adapted to receive diffracted or scattered radiation propagating either along the symmetry axis, or parallel with the symmetry axis, or both along and parallel with the symmetry axis (105). Upon incidence of the conical shell beam (150) onto a sample (106) the first energy resolving detector (180) detects radiation diffracted or scattered by the sample (106) via the collimator (170).

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