Invention Grant
- Patent Title: Multi-gate metal-oxide-semiconductor field effect transistor
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Application No.: US17345090Application Date: 2021-06-11
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Publication No.: US11728345B2Publication Date: 2023-08-15
- Inventor: Dong-chan Suh , Gi-gwan Park , Dong-woo Kim , Dong-suk Shin
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Lee IP Law, P.C.
- Priority: KR 20160077545 2016.06.21
- Main IPC: H01L27/092
- IPC: H01L27/092 ; H01L21/8238 ; H01L29/165 ; H01L29/66 ; H01L29/04 ; H01L29/06 ; H01L29/423 ; H01L29/786

Abstract:
A semiconductor device includes a substrate including a first region and a second region, fin type active areas extending in a first direction away from the substrate in each of the first and second regions, a plurality of nanosheets extending parallel to an upper surface of the fin type active areas and being spaced apart from the upper surface of the fin type active areas, a gate extending over the fin type active areas in a second direction crossing the first direction, a gate dielectric layer interposed between the gate and each of the nanosheets, first source and drain regions included in the first region and second source and drain regions included in the second region, and insulating spacers interposed between the fin type active areas and the nanosheets, wherein air spacers are interposed between the insulating spacers and the first source and drain regions.
Public/Granted literature
- US20210305253A1 SEMICONDUCTOR DEVICE Public/Granted day:2021-09-30
Information query
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