Invention Grant
- Patent Title: Structure and method for semiconductor devices
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Application No.: US17590409Application Date: 2022-02-01
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Publication No.: US11728402B2Publication Date: 2023-08-15
- Inventor: Jhon Jhy Liaw
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- The original application number of the division: US16585636 2019.09.27
- Main IPC: H01L29/423
- IPC: H01L29/423 ; H01L29/78 ; H01L29/06 ; H01L29/08 ; H01L29/66 ; H01L29/49 ; H01L29/786 ; H01L21/306 ; H01L21/3065

Abstract:
The present disclosure provides an integrated circuit (IC) device, including: a semiconductor substrate having a top surface; a first source/drain feature and a second source/drain feature disposed on the semiconductor substrate; and a plurality of semiconductor layers including a first semiconductor layer and a second semiconductor layer. Each of the first semiconductor layer and the second semiconductor layer extends longitudinally in a first direction and connects the first source/drain feature and the second source/drain feature. The first semiconductor layer is stacked over the second semiconductor layer in a second direction perpendicular to the first direction. A length of the first semiconductor layer along the first direction is less than a length of the second semiconductor layer along the first direction. The IC device further includes a gate structure engaging center portions of the first semiconductor layer and the second semiconductor layer.
Public/Granted literature
- US20220157963A1 Structure and Method for Semiconductor Devices Public/Granted day:2022-05-19
Information query
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