A metrology device includes a housing, a lower support structure, a PCB coupled to the lower support structure, and a cover coupled to the lower support structure and the housing. The housing supports the cover in three coordinate directions. The lower support structure includes a first pillar that supports the PCB and mechanically couples with the cover. The first pillar causes the PCB to stand off from the lower support structure and causes the cover to stand off from the PCB. The metrology device also includes a second pillar that extends from the lower support structure to a base to cause the lower support structure to stand off from the base. The cover has a non-circle shape, and a cross section of the housing at a same elevation of the housing as an elevation of the cover within the housing is a circle.