- Patent Title: Hybrid synchronous and asynchronous control for scan-based testing
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Application No.: US17646184Application Date: 2021-12-28
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Publication No.: US11755804B2Publication Date: 2023-09-12
- Inventor: Albert Shih-Huai Lin , Rambabu Nerukonda , Niravkumar Patel , Amitava Majumdar
- Applicant: Xilinx, Inc.
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent Kevin T. Cuenot
- Main IPC: G06F30/333
- IPC: G06F30/333 ; G06F30/367 ; G06F30/396 ; G06F30/398 ; G06F30/20 ; G06F11/267 ; G06F11/27 ; H01L25/00 ; H03K19/17732 ; H03K19/17764 ; G06F115/08 ; H01L21/66

Abstract:
An integrated circuit includes an intellectual property core, scan data pipeline circuitry configured to convey scan data to the intellectual property core, and scan control pipeline circuitry configured to convey one or more scan control signals to the intellectual property core. The integrated circuit also includes a wave shaping circuit configured to detect a trigger event on the one or more scan control signals and, in response to detecting the trigger event, suppress a scan clock to the intellectual property core for a selected number of clock cycles.
Public/Granted literature
- US20230205959A1 HYBRID SYNCHRONOUS AND ASYNCHRONOUS CONTROL FOR SCAN-BASED TESTING Public/Granted day:2023-06-29
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