Invention Grant
- Patent Title: Chip-stacked semiconductor package with increased package reliability
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Application No.: US17352757Application Date: 2021-06-21
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Publication No.: US11756935B2Publication Date: 2023-09-12
- Inventor: Insup Shin , Hyeongmun Kang , Jungmin Ko , Hwanyoung Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. Chau & Associates, LLC
- Priority: KR 20200076762 2020.06.23
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L25/18 ; H01L25/00

Abstract:
A chip-stacked semiconductor package includes: a base chip having a base through via; a first chip stacked on the base chip in an offset form, wherein the first chip has a first exposed surface and a first through via electrically connected to the base through via; a first molding layer positioned on the base chip and covering a first non-exposed surface, facing the first exposed surface, of the first chip; a second chip stacked on the first chip in an offset form, wherein the second chip has a second exposed surface and a second through via electrically connected to the first through via; and a second molding layer formed on the first chip and covering a second non-exposed surface, facing the second exposed surface, of the second chip.
Public/Granted literature
- US20210398947A1 CHIP-STACKED SEMICONDUCTOR PACKAGE WITH INCREASED PACKAGE RELIABILITY Public/Granted day:2021-12-23
Information query
IPC分类: