Invention Grant
- Patent Title: Failure detection apparatus and method and non-transitory computer-readable storage medium
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Application No.: US17412418Application Date: 2021-08-26
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Publication No.: US11770213B2Publication Date: 2023-09-26
- Inventor: Takashi Sudo
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP 20209260 2020.12.17
- Main IPC: H04R3/00
- IPC: H04R3/00 ; H04L1/04 ; H04L43/067 ; H04L1/00 ; H04L1/1607 ; H04R29/00
Abstract:
According to one embodiment, a failure detection apparatus includes processing circuitry. The processing circuitry acquires a time-series signal generated by a sensor module, generates an analysis result including information concerning saturation of the time-series signal by analyzing the time-series signal, and determine a failure of the sensor module based on the analysis result.
Public/Granted literature
- US20220200731A1 FAILURE DETECTION APPARATUS AND METHOD AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM Public/Granted day:2022-06-23
Information query
