Invention Grant
- Patent Title: Magnetometry based on electron spin defects
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Application No.: US17472209Application Date: 2021-09-10
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Publication No.: US11774526B2Publication Date: 2023-10-03
- Inventor: Stefan Bogdanovic , Stefan Leichenauer
- Applicant: X Development LLC
- Applicant Address: US CA Mountain View
- Assignee: X Development LLC
- Current Assignee: X Development LLC
- Current Assignee Address: US CA Mountain View
- Agency: Fish & Richardson P.C.
- Main IPC: G01R33/32
- IPC: G01R33/32 ; G01N24/10 ; G01R33/26

Abstract:
A magnetometer includes a sample signal device; a reference signal device; a microwave field generator operable to apply a microwave field to the sample signal device and the reference signal device; an optical source configured to emit light including light of a first wavelength that interacts optically with the sample signal device and with the reference signal device; at least one photodetector arranged to detect a sample photoluminescence signal including light of a second wavelength emitted from the sample signal device and a reference photoluminescence signal including light of the second wavelength emitted from the reference signal device, in which the first wavelength is different from the second wavelength; and a magnet arranged adjacent to the sample signal device and the reference signal device.
Public/Granted literature
- US20220075013A1 MAGNETOMETRY BASED ON ELECTRON SPIN DEFECTS Public/Granted day:2022-03-10
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