公开(公告)号：US20230408607A1

公开(公告)日：2023-12-21

申请号：US18239687

申请日：2023-08-29

Applicant: X Development LLC

Inventor： Stefan Bogdanovic ,  Stefan Leichenauer

IPC: G01R33/32 ,  G01N24/10 ,  G01R33/26

CPC classification number: G01R33/323 ,  G01R33/26 ,  G01N24/10

Abstract: A magnetometer includes a sample signal device; a reference signal device; a microwave field generator operable to apply a microwave field to the sample signal device and the reference signal device; an optical source configured to emit light including light of a first wavelength that interacts optically with the sample signal device and with the reference signal device; at least one photodetector arranged to detect a sample photoluminescence signal including light of a second wavelength emitted from the sample signal device and a reference photoluminescence signal including light of the second wavelength emitted from the reference signal device, in which the first wavelength is different from the second wavelength; and a magnet arranged adjacent to the sample signal device and the reference signal device.

公开(公告)号：US20240004002A1

公开(公告)日：2024-01-04

申请号：US18239663

申请日：2023-08-29

Applicant: X Development LLC

Inventor： Stefan Bogdanovic ,  Stefan Leichenauer

IPC: G01R33/32 ,  G01N24/10 ,  G01R33/26

CPC classification number: G01R33/323 ,  G01N24/10 ,  G01R33/26

Abstract: A magnetometer includes a sample signal device; a reference signal device; a microwave field generator operable to apply a microwave field to the sample signal device and the reference signal device; an optical source configured to emit light including light of a first wavelength that interacts optically with the sample signal device and with the reference signal device; at least one photodetector arranged to detect a sample photoluminescence signal including light of a second wavelength emitted from the sample signal device and a reference photoluminescence signal including light of the second wavelength emitted from the reference signal device, in which the first wavelength is different from the second wavelength; and a magnet arranged adjacent to the sample signal device and the reference signal device.

公开(公告)号：US20210196177A1

公开(公告)日：2021-07-01

申请号：US17138696

申请日：2020-12-30

Applicant: X Development LLC

Inventor： Guillaume Verdon-Akzam ,  Xudong Lv ,  Stefan Leichenauer

IPC: A61B5/245 ,  A61B5/00

Abstract: A magnetoencephalography apparatus includes: a lead configured to be secured to a user's head; a first magnetic field sensor attached to the lead, the first magnetic field sensor including a substrate, and an electron spin defect layer on the substrate, the electron spin defect layer including at least one lattice defect, in which a first spin energy level of the at least one lattice defect splits upon exposure to a microwave; and cabling, in which the cabling includes a first microwave transmission line arranged to provide a first microwave field to the electron spin defect layer and in which the cabling includes an optical fiber arranged to provide, from a first end of the optical fiber, a first light signal to the electron spin defect layer and to receive, at the first end of the optical fiber, a second light signal emitted by the electron spin defect layer.

公开(公告)号：US11774526B2

公开(公告)日：2023-10-03

申请号：US17472209

申请日：2021-09-10

Applicant: X Development LLC

Inventor： Stefan Bogdanovic ,  Stefan Leichenauer

IPC: G01R33/32 ,  G01N24/10 ,  G01R33/26

CPC classification number: G01R33/323 ,  G01N24/10 ,  G01R33/26

Abstract: A magnetometer includes a sample signal device; a reference signal device; a microwave field generator operable to apply a microwave field to the sample signal device and the reference signal device; an optical source configured to emit light including light of a first wavelength that interacts optically with the sample signal device and with the reference signal device; at least one photodetector arranged to detect a sample photoluminescence signal including light of a second wavelength emitted from the sample signal device and a reference photoluminescence signal including light of the second wavelength emitted from the reference signal device, in which the first wavelength is different from the second wavelength; and a magnet arranged adjacent to the sample signal device and the reference signal device.

公开(公告)号：US20220075013A1

公开(公告)日：2022-03-10

申请号：US17472209

申请日：2021-09-10

Applicant: X Development LLC

Inventor： Stefan Bogdanovic ,  Stefan Leichenauer

IPC: G01R33/32 ,  G01N24/10 ,  G01R33/26

Abstract: A magnetometer includes a sample signal device; a reference signal device; a microwave field generator operable to apply a microwave field to the sample signal device and the reference signal device; an optical source configured to emit light including light of a first wavelength that interacts optically with the sample signal device and with the reference signal device; at least one photodetector arranged to detect a sample photoluminescence signal including light of a second wavelength emitted from the sample signal device and a reference photoluminescence signal including light of the second wavelength emitted from the reference signal device, in which the first wavelength is different from the second wavelength; and a magnet arranged adjacent to the sample signal device and the reference signal device.