Invention Grant
- Patent Title: Memory structure
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Application No.: US17979789Application Date: 2022-11-03
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Publication No.: US11778830B2Publication Date: 2023-10-03
- Inventor: Chia-Hung Chen , Yu-Huang Yeh , Chuan-Fu Wang
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: CN 2110041163.4 2021.01.13
- The original application number of the division: US17201986 2021.03.15
- Main IPC: H10B43/30
- IPC: H10B43/30 ; H10B41/10 ; H10B41/30 ; H10B43/10

Abstract:
A memory structure including a substrate, a first dielectric layer, a second dielectric layer, a charge storage layer, an oxide layer, and a conductive layer is provided. The first dielectric layer is disposed on the substrate. The second dielectric layer is disposed on the first dielectric layer. The charge storage layer is disposed between the first dielectric layer and the second dielectric layer. The oxide layer is located at two ends of the charge storage layer and is disposed between the first dielectric layer and the second dielectric layer. The conductive layer is disposed on the second dielectric layer.
Public/Granted literature
- US20230046058A1 MEMORY STRUCTURE Public/Granted day:2023-02-16
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