Invention Grant
- Patent Title: Methods and apparatus to improve feature engineering efficiency with metadata unit operations
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Application No.: US17140797Application Date: 2021-01-04
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Publication No.: US11783029B2Publication Date: 2023-10-10
- Inventor: Chih-Yuan Yang , Yi Gai
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: HANLEY, FLIGHT & ZIMMERMAN, LLC
- Main IPC: G06F21/55
- IPC: G06F21/55 ; G06F21/52 ; G06N20/00 ; G06N20/10

Abstract:
Methods, apparatus, systems and articles of manufacture are disclosed to improve feature engineering efficiency. An example method disclosed herein includes retrieving a log file in a first file format, the log file containing feature occurrence data, generating a first unit operation based on the first file format to extract the feature occurrence data from the log file to a string, the first unit operation associated with a first metadata tag, generating second unit operations to identify respective features from the feature occurrence data, the second unit operations associated with respective second metadata tags, and generating a first sequence of the first metadata tag and the second metadata tags to create a first vector output file of the feature occurrence data.
Public/Granted literature
- US20210200863A1 METHODS AND APPARATUS TO IMPROVE FEATURE ENGINEERING EFFICIENCY WITH METADATA UNIT OPERATIONS Public/Granted day:2021-07-01
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