Invention Grant
- Patent Title: On-chip testing architecture for display system
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Application No.: US17397953Application Date: 2021-08-09
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Publication No.: US11783739B2Publication Date: 2023-10-10
- Inventor: Hasan Akyol , Xuebei Yang , Chung-Lun Edwin Hsu , Henry C. Jen , John T. Wetherell
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Fletcher Yoder, P.C.
- Main IPC: G09G3/00
- IPC: G09G3/00

Abstract:
Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.
Public/Granted literature
- US20220076599A1 ON-CHIP TESTING ARCHITECTURE FOR DISPLAY SYSTEM Public/Granted day:2022-03-10
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