Invention Grant
- Patent Title: Method for manufacturing gallium nitride semiconductor device
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Application No.: US17229356Application Date: 2021-04-13
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Publication No.: US11784039B2Publication Date: 2023-10-10
- Inventor: Jun Kojima , Chiaki Sasaoka , Shoichi Onda , Masatake Nagaya , Kazukuni Hara , Daisuke Kawaguchi
- Applicant: DENSO CORPORATION , HAMAMATSU PHOTONICS K.K. , National University Corporation Tokai National Higher Education and Research System
- Applicant Address: JP Kariya
- Assignee: DENSO CORPORATION,HAMAMATSU PHOTONICS K.K.,National University Corporation Tokai National Higher Education and Research System
- Current Assignee: DENSO CORPORATION,HAMAMATSU PHOTONICS K.K.,National University Corporation Tokai National Higher Education and Research System
- Current Assignee Address: JP Kariya; JP Hamamatsu; JP Nagoya
- Agency: POSZ LAW GROUP, PLC
- Priority: JP 20073159 2020.04.15
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/78 ; H01L21/8252

Abstract:
A method for manufacturing a gallium nitride semiconductor device includes: preparing a gallium nitride wafer; forming an epitaxial growth film on the gallium nitride wafer to provide a processed wafer having chip formation regions; perform a surface side process on a one surface side of the processed wafer; removing the gallium nitride wafer and dividing the processed wafer into a chip formation wafer and a recycle wafer; and forming an other surface side element component on an other surface side of the chip formation wafer.
Public/Granted literature
- US20210327702A1 METHOD FOR MANUFACTURING GALLIUM NITRIDE SEMICONDUCTOR DEVICE Public/Granted day:2021-10-21
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