Invention Grant
- Patent Title: User-interactive defect analysis for root cause
-
Application No.: US17729972Application Date: 2022-04-26
-
Publication No.: US11789931B2Publication Date: 2023-10-17
- Inventor: Jason Ma , Allen Cai , Andrew Cooper , Arnaud Drizard , Benjamin Lee , Damien Cramard , Damian Rusak , Hind Kraytem , Jan Matas , Ludovic Lay , Myles Scolnick , Radu-Andrei Szasz , Stefan Negrus , Taylor Cathcart , Zhixian Shen
- Applicant: Palantir Technologies Inc.
- Applicant Address: US CA Palo Alto
- Assignee: Palantir Technologies Inc.
- Current Assignee: Palantir Technologies Inc.
- Current Assignee Address: US CO Denver
- Agency: Sheppard Mullin Richter & Hampton LLP
- Main IPC: G06F16/23
- IPC: G06F16/23 ; G06F3/04847 ; G06F16/215 ; G06F16/25 ; G06F16/22 ; G06F16/9535

Abstract:
Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.
Public/Granted literature
- US20220253431A1 USER-INTERACTIVE DEFECT ANALYSIS FOR ROOT CAUSE Public/Granted day:2022-08-11
Information query