公开(公告)号：US10360252B1

公开(公告)日：2019-07-23

申请号：US15910672

申请日：2018-03-02

Applicant: Palantir Technologies Inc.

Inventor： Hind Kraytem ,  Arnaud Drizard ,  Ludovic Lay ,  Jean Caillé

IPC: G06F17/00 ,  G06F16/38 ,  G06F3/0482 ,  G06F17/24 ,  G06F16/335

Abstract: Data stored in large scale systems often includes significant amounts of data and metadata. The data and metadata provide valuable structures for efficient data organization and analysis. However, when the data or metadata is missing, the missing data or metadata can cause disruption in organization and analysis efforts. A system with interactive user interfaces for enrichment of missing data or metadata is described. The system provides various dynamic filters to detect and identify data items with missing data or metadata. The system also provides for intuitive and efficient navigation of data items for determination of the missing data or metadata. Via its user interfaces, the system enables users to supply, or enrich, the missing data or metadata. Additionally, the user interfaces enable users to dynamically change available data or metadata values used for enrichment. Also, the system generates enriched output data sets, which may facilitate analysis of processes and systems.

公开(公告)号：US20220292010A1

公开(公告)日：2022-09-15

申请号：US17752370

申请日：2022-05-24

Applicant: Palantir Technologies Inc.

Inventor： Arnaud Drizard ,  Christopher McFarland ,  Hind Kraytem ,  Jean Caillé ,  Ludovic Lay

IPC: G06F11/36 ,  G06F8/70 ,  G06F8/10

Abstract: Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.

公开(公告)号：US20190286646A1

公开(公告)日：2019-09-19

申请号：US16433384

申请日：2019-06-06

Applicant: Palantir Technologies Inc.

Inventor： Hind Kraytem ,  Arnaud Drizard ,  Ludovic Lay ,  Jean Caillé

IPC: G06F16/38 ,  G06F17/24 ,  G06F16/335 ,  G06F3/0482

Abstract: Data stored in large scale systems often includes significant amounts of data and metadata. The data and metadata provide valuable structures for efficient data organization and analysis. However, when the data or metadata is missing, the missing data or metadata can cause disruption in organization and analysis efforts. A system with interactive user interfaces for enrichment of missing data or metadata is described. The system provides various dynamic filters to detect and identify data items with missing data or metadata. The system also provides for intuitive and efficient navigation of data items for determination of the missing data or metadata. Via its user interfaces, the system enables users to supply, or enrich, the missing data or metadata. Additionally, the user interfaces enable users to dynamically change available data or metadata values used for enrichment. Also, the system generates enriched output data sets, which may facilitate analysis of processes and systems.

公开(公告)号：US11789931B2

公开(公告)日：2023-10-17

申请号：US17729972

申请日：2022-04-26

Applicant: Palantir Technologies Inc.

Inventor： Jason Ma ,  Allen Cai ,  Andrew Cooper ,  Arnaud Drizard ,  Benjamin Lee ,  Damien Cramard ,  Damian Rusak ,  Hind Kraytem ,  Jan Matas ,  Ludovic Lay ,  Myles Scolnick ,  Radu-Andrei Szasz ,  Stefan Negrus ,  Taylor Cathcart ,  Zhixian Shen

IPC: G06F16/23 ,  G06F3/04847 ,  G06F16/215 ,  G06F16/25 ,  G06F16/22 ,  G06F16/9535

CPC classification number: G06F16/2365 ,  G06F3/04847 ,  G06F16/215 ,  G06F16/2282 ,  G06F16/252 ,  G06F16/9535

Abstract: Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.

公开(公告)号：US11645250B2

公开(公告)日：2023-05-09

申请号：US16433384

申请日：2019-06-06

Applicant: Palantir Technologies Inc.

Inventor： Hind Kraytem ,  Arnaud Drizard ,  Ludovic Lay ,  Jean Caillé

IPC: G06F16/215 ,  G06F3/0482 ,  G06F16/38 ,  G06F16/335 ,  G06F40/18 ,  G06F40/205

CPC classification number: G06F16/215 ,  G06F3/0482 ,  G06F16/335 ,  G06F16/38 ,  G06F16/381 ,  G06F40/18 ,  G06F40/205

Abstract: Data stored in large scale systems often includes significant amounts of data and metadata. The data and metadata provide valuable structures for efficient data organization and analysis. However, when the data or metadata is missing, the missing data or metadata can cause disruption in organization and analysis efforts. A system with interactive user interfaces for enrichment of missing data or metadata is described. The system provides various dynamic filters to detect and identify data items with missing data or metadata. The system also provides for intuitive and efficient navigation of data items for determination of the missing data or metadata. Via its user interfaces, the system enables users to supply, or enrich, the missing data or metadata. Additionally, the user interfaces enable users to dynamically change available data or metadata values used for enrichment. Also, the system generates enriched output data sets, which may facilitate analysis of processes and systems.

公开(公告)号：US11314721B1

公开(公告)日：2022-04-26

申请号：US15928884

申请日：2018-03-22

Applicant: Palantir Technologies Inc.

Inventor： Jason Ma ,  Allen Cai ,  Andrew Cooper ,  Arnaud Drizard ,  Benjamin Lee ,  Damien Cramard ,  Damian Rusak ,  Hind Kraytem ,  Jan Matas ,  Ludovic Lay ,  Myles Scolnick ,  Radu-Andrei Szasz ,  Stefan Negrus ,  Taylor Cathcart ,  Zhixian Shen

IPC: G06F16/23 ,  G06F3/04847 ,  G06F16/215 ,  G06F16/25 ,  G06F16/22 ,  G06F16/9535

Abstract: Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.

公开(公告)号：US11755454B2

公开(公告)日：2023-09-12

申请号：US17752370

申请日：2022-05-24

Applicant: Palantir Technologies Inc.

Inventor： Arnaud Drizard ,  Christopher McFarland ,  Hind Kraytem ,  Jean Caillé ,  Ludovic Lay

IPC: G06F9/44 ,  G06F11/36 ,  G06F8/70 ,  G06F8/10

CPC classification number: G06F11/3604 ,  G06F8/10 ,  G06F8/70 ,  G06F11/3668

Abstract: Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.

公开(公告)号：US20220253431A1

公开(公告)日：2022-08-11

申请号：US17729972

申请日：2022-04-26

Applicant: Palantir Technologies Inc.

Inventor： Jason Ma ,  Allen Cai ,  Andrew Cooper ,  Arnaud Drizard ,  Benjamin Lee ,  Damien Cramard ,  Damian Rusak ,  Hind Kraytem ,  Jan Matas ,  Ludovic Lay ,  Myles Scolnick ,  Radu-Andrei Szasz ,  Stefan Negrus ,  Taylor Cathcart ,  Zhixian Shen

IPC: G06F16/23 ,  G06F3/04847 ,  G06F16/215 ,  G06F16/25 ,  G06F16/22 ,  G06F16/9535

Abstract: Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.

公开(公告)号：US11341027B1

公开(公告)日：2022-05-24

申请号：US16250818

申请日：2019-01-17

Applicant: Palantir Technologies Inc.

Inventor： Arnaud Drizard ,  Christopher McFarland ,  Hind Kraytem ,  Jean Caillé ,  Ludovic Lay

IPC: G06F9/44 ,  G06F11/36 ,  G06F8/70 ,  G06F8/10

Abstract: Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects.