- 专利标题: Method and apparatus for layer thickness control in additive manufacturing
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申请号: US16280336申请日: 2019-02-20
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公开(公告)号: US11794412B2公开(公告)日: 2023-10-24
- 发明人: Meredith Elissa Dubelman , Mary Kathryn Thompson , Christopher Barnhill , Xi Yang
- 申请人: General Electric Company
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: Dinsmore & Shohl LLP
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; B29C64/393 ; B29C64/245 ; B29C64/135 ; B29C64/268 ; B33Y10/00 ; B33Y30/00 ; B33Y50/02
摘要:
An additive manufacturing apparatus is disclosed. The apparatus includes a build surface, at least a portion of which is transparent. The apparatus includes a first material depositor operable to deposit a curable resin to form a deposited resin layer on the build surface. A first sensing device is configured to measure the thickness of the deposited resin layer; and wherein the at least one sensing device is configured to generate a signal indicative of the thickness of the deposited resin layer. The first sensing device can be connected to a computer such that the additive manufacturing apparatus is configured to control the thickness of the deposited resin layer. The thickness of the deposited resin layer can be controlled such that it varies from side to side, i.e. across the width of the deposited resin layer in the transverse direction along the x-axis. The thickness can also be controlled such that it varies with time, i.e., in the machine direction along the y-axis.
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