Invention Grant
- Patent Title: Apparatus for measuring optical characteristics of a test optical element under low-temperature environment
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Application No.: US17334023Application Date: 2021-05-28
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Publication No.: US11808938B2Publication Date: 2023-11-07
- Inventor: Wei-Ting Chiu , Chu-Tsung Chan , Sandeep Kumar Paral , Chia-Chang Lee
- Applicant: YOUNG OPTICS INC.
- Applicant Address: TW Hsinchu Science Park
- Assignee: YOUNG OPTICS INC.
- Current Assignee: YOUNG OPTICS INC.
- Current Assignee Address: TW Hsinchu Science Park
- Agency: Muncy, Geissler, Olds & Lowe
- Priority: TW 9118932 2020.06.05
- Main IPC: G02B27/00
- IPC: G02B27/00 ; G01J1/02 ; G02B7/02 ; G01M11/02

Abstract:
An optical measurement apparatus includes a thermal insulation housing, a first light-transmissive plate, a second light-transmissive plate, a heat-conductive layer, a cooling source and a photosensor. The thermal insulation housing, the first light-transmissive plate and the second light-transmissive plate define a chamber. The heat-conductive layer is disposed in the chamber, the cooling source is coupled to the heat-conductive layer, and the photosensor is disposed outside the chamber and on one side of the second light-transmissive plate facing away from the first light-transmissive plate.
Public/Granted literature
- US20210382301A1 OPTICAL MEASUREMENT APPARATUS Public/Granted day:2021-12-09
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