Invention Grant
- Patent Title: Method and apparatus for measuring three-dimensional refractive index tensor
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Application No.: US17753479Application Date: 2021-01-07
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Publication No.: US11821834B2Publication Date: 2023-11-21
- Inventor: Yongkeun Park , Seungwoo Shin
- Applicant: TOMOCUBE, INC. , KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Applicant Address: KR Daejeon
- Assignee: TOMOCUBE, INC.,KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee: TOMOCUBE, INC.,KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee Address: KR Daejeon; KR Daejeon
- Agency: Hoffman Warnick LLC
- Priority: KR 20200023424 2020.02.26
- International Application: PCT/KR2021/000157 2021.01.07
- International Announcement: WO2021/172734A 2021.09.02
- Date entered country: 2022-03-03
- Main IPC: G01N21/23
- IPC: G01N21/23 ; G01B9/02 ; G01N21/41 ; G01N21/45 ; G01N21/17

Abstract:
A method and apparatus for measuring a 3-D refractive index tensor are presented. The method for measuring a 3-D refractive index tensor according to an embodiment comprises the steps of: controlling incident light of a plane wave with respect to at least one angle and polarization; and measuring, in a polarization-dependent manner, the 2-D diffracted light of a specimen with respect to the incident light incident at the at least one angle and polarization, wherein the birefringence value and the 3-D structure of an alignment direction of molecules in the specimen having birefringence may be measured.
Public/Granted literature
- US20220404267A1 METHOD AND APPARATUS FOR MEASURING THREE-DIMENSIONAL REFRACTIVE INDEX TENSOR Public/Granted day:2022-12-22
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