Method and apparatus for measuring three-dimensional refractive index tensor
Abstract:
A method and apparatus for measuring a 3-D refractive index tensor are presented. The method for measuring a 3-D refractive index tensor according to an embodiment comprises the steps of: controlling incident light of a plane wave with respect to at least one angle and polarization; and measuring, in a polarization-dependent manner, the 2-D diffracted light of a specimen with respect to the incident light incident at the at least one angle and polarization, wherein the birefringence value and the 3-D structure of an alignment direction of molecules in the specimen having birefringence may be measured.
Information query
Patent Agency Ranking
0/0