• 专利标题: Automatic analysis apparatus and method of controlling automatic analysis apparatus
  • 申请号: US17229191
    申请日: 2021-04-13
  • 公开(公告)号: US11828765B2
    公开(公告)日: 2023-11-28
  • 发明人: Tamami KanedaMakoto Asakura
  • 申请人: JEOL Ltd.
  • 申请人地址: JP Tokyo
  • 专利权人: JEOL Ltd.
  • 当前专利权人: JEOL Ltd.
  • 当前专利权人地址: JP Tokyo
  • 代理机构: THE WEBB LAW FIRM
  • 优先权: JP 20072338 2020.04.14
  • 主分类号: G01N35/00
  • IPC分类号: G01N35/00
Automatic analysis apparatus and method of controlling automatic analysis apparatus
摘要:
An automatic analysis apparatus of the present invention includes: a measurement section that measures a sample; a remaining quantity detecting section that detects that a remaining quantity of a consumable article used in the measurement section has become less than or equal to a predetermined quantity that is set in advance; a setting section that is capable of setting in which mode, of a first mode and a second mode applied for operation control of the measurement section, to operate the measurement section for each consumable article when the remaining quantity detecting section detects that the remaining quantity of the consumable article has become less than or equal to the predetermined quantity; and a control section that controls operation of the measurement section based on the setting of the setting section.
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