Invention Grant
- Patent Title: Reflective photomask and method for fabricating the same
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Application No.: US17501085Application Date: 2021-10-14
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Publication No.: US11829063B2Publication Date: 2023-11-28
- Inventor: Sang Uk Park , Jong Ju Park , Jong Keun Oh
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. CHAU & ASSOCIATES, LLC
- Priority: KR 20210027211 2021.03.02
- Main IPC: G03F1/24
- IPC: G03F1/24

Abstract:
A reflective photomask includes a pattern area, a non-pattern area at least partially surrounding the pattern area, and a black border area interposed between the pattern area and the non-pattern area. The reflective photomask includes a mask substrate, a reflector layer stacked on the mask substrate, and an absorber layer stacked on the reflector layer. The black border area includes a plurality of first anneal patterns which are arranged along an edge of the pattern area and each have an island shape, and a second anneal pattern which fills inside of the black border area and has a line shape.
Public/Granted literature
- US20220283489A1 REFLECTIVE PHOTOMASK AND METHOD FOR FABRICATING THE SAME Public/Granted day:2022-09-08
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