Invention Grant
- Patent Title: Devices and methods for measuring a magnetic field gradient
-
Application No.: US18147170Application Date: 2022-12-28
-
Publication No.: US11846687B2Publication Date: 2023-12-19
- Inventor: Nicolas Dupre , Yves Bidaux
- Applicant: Melexis Technologies SA
- Applicant Address: CH Bevaix
- Assignee: MELEXIS TECHNOLOGIES SA
- Current Assignee: MELEXIS TECHNOLOGIES SA
- Current Assignee Address: CH Bevaix
- Agency: WORKMAN NYDEGGER
- Priority: EP 165059 2020.03.23
- Main IPC: G01R33/07
- IPC: G01R33/07 ; G01R33/022 ; G01R33/00

Abstract:
A method of determining a gradient of a magnetic field, includes the steps of: biasing a first/second magnetic sensor with a first/second biasing signal; measuring and amplifying a first/second magnetic sensor signal; measuring a temperature and/or a stress difference; adjusting at least one of: the second biasing signal, the second amplifier gain, the amplified and digitized second sensor value using a predefined function f(T) or f(T, ΔΣ) or f(ΔΣ) of the measured temperature and/or the measured differential stress before determining a difference between the first/second signal/value derived from the first/second sensor signal. A magnetic sensor device is configured for performing this method, as well as a current sensor device, and a position sensor device.
Public/Granted literature
- US20230160979A1 DEVICES AND METHODS FOR MEASURING A MAGNETIC FIELD GRADIENT Public/Granted day:2023-05-25
Information query