Invention Grant
- Patent Title: Semiconductor package with improved reliability
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Application No.: US17512665Application Date: 2021-10-27
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Publication No.: US11854924B2Publication Date: 2023-12-26
- Inventor: Tien-Chang Chang , Yan-Liang Ji
- Applicant: MEDIATEK INC.
- Applicant Address: TW Hsin-Chu
- Assignee: MEDIATEK INC.
- Current Assignee: MEDIATEK INC.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: H01L23/495
- IPC: H01L23/495 ; H01L23/31 ; H01L23/498 ; H01L23/00

Abstract:
A semiconductor device includes a semiconductor die having an active surface, an opposite surface, a vertical sidewall extending between the active surface and the opposite surface, and input/output (I/O) connections disposed on the active surface. A redistribution layer (RDL) is disposed on the active surface of the semiconductor die. A plurality of first connecting elements is disposed on the RDL. A molding compound encapsulates the opposite surface and the vertical sidewall of the semiconductor die. The molding compound also covers the RDL and surrounds the plurality of first connecting elements. An interconnect substrate is mounted on the plurality of first connecting elements and on the molding compound.
Public/Granted literature
- US20220181228A1 SEMICONDUCTOR PACKAGE WITH IMPROVED RELIABILITY Public/Granted day:2022-06-09
Information query
IPC分类: