Invention Grant
- Patent Title: Semiconductor device and measurement device
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Application No.: US17708955Application Date: 2022-03-30
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Publication No.: US11854952B2Publication Date: 2023-12-26
- Inventor: Toshihisa Sone , Kazuya Yamada , Akihiro Takei , Yuichi Yoshida , Kengo Takemasa
- Applicant: LAPIS Semiconductor Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee Address: JP Yokohama
- Agency: Rabin & Berdo, P.C.
- Priority: JP 12104181 2012.04.27
- The original application number of the division: US14997658 2016.01.18
- Main IPC: H01L23/29
- IPC: H01L23/29 ; H01L23/495 ; H01L23/31 ; H01L23/00 ; H01L25/18 ; H01L21/56

Abstract:
A semiconductor device includes: an oscillator including external terminals disposed on a first face with a specific distance along a first direction; an integrated circuit including a first region formed with first electrode pads along one side, and a second region formed with second electrode pads on two opposing sides of the first region; a lead frame that includes terminals at a peripheral portion, and on which the oscillator and the integrated circuit are mounted such that the external terminals, the first and second electrode pads face in a substantially same direction and such that one side of the integrated circuit is substantially parallel to the first direction; a first bonding wire that connects one external terminal to one first electrode pad; a second bonding wire that connects one terminal of one lead frame to one second electrode pad; and a sealing member that seals all of the components.
Public/Granted literature
- US20220223505A1 SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE Public/Granted day:2022-07-14
Information query
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