Invention Grant
- Patent Title: Probe head and probe card having same
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Application No.: US17161460Application Date: 2021-01-28
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Publication No.: US11860192B2Publication Date: 2024-01-02
- Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
- Applicant: POINT ENGINEERING CO., LTD.
- Applicant Address: KR Asan
- Assignee: POINT ENGINEERING CO., LTD.
- Current Assignee: POINT ENGINEERING CO., LTD.
- Current Assignee Address: KR Asan
- Priority: KR 20200011850 2020.01.31
- Main IPC: G01R1/073
- IPC: G01R1/073

Abstract:
Proposed are a probe head and a probe card having the same. According to the present disclosure, the probe head of the probe card includes: an upper guide plate having an upper guide hole; a lower guide plate having a lower guide hole; and an intermediate guide plate having an intermediate guide hole and provided between the upper guide plate and the lower guide plate, wherein each of a plurality of probes sequentially passes through the upper guide hole, the intermediate guide hole, and the lower guide hole, and the intermediate guide plate is made of an anodic oxide film.
Public/Granted literature
- US20210239735A1 PROBE HEAD AND PROBE CARD HAVING SAME Public/Granted day:2021-08-05
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