Invention Grant
- Patent Title: System and method for performing measurements of antenna under test offset from center of quiet zone
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Application No.: US17059572Application Date: 2020-10-22
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Publication No.: US11879924B2Publication Date: 2024-01-23
- Inventor: Zhu Wen , Ya Jing , Li Cao , Thorsten Hertel
- Applicant: Keysight Technologies, Inc.
- Applicant Address: US CA Santa Rosa
- Assignee: KEYSIGHT TECHNOLOGIES, INC.
- Current Assignee: KEYSIGHT TECHNOLOGIES, INC.
- Current Assignee Address: US CA Santa Rosa
- International Application: PCT/CN2020/122906 2020.10.22
- International Announcement: WO2022/082634A 2022.04.28
- Date entered country: 2020-11-30
- Main IPC: G01R29/08
- IPC: G01R29/08 ; G01R29/10

Abstract:
A system and method are provided to determine at least one of equivalent isotropic radiated power (EIRP) or effective isotropic sensitivity (EIS) of an antenna under test (AUT) in a test chamber, the AUT including an antenna array with an array phase center that is offset from a center of a quiet zone of the test chamber. The method includes performing a local beam peak direction scan of an antenna pattern of the AUT using a probe antenna located at laterally offset positions at a near-field distance from the AUT to determine a beam peak direction; performing EIRP and/or EIS near-field measurements of the AUT in the determined beam peak direction using the probe antenna located at near-field distances from the AUT in a radial direction; deriving a far-field equivalent of the EIRP and/or EIS near-field measurement along the determined beam peak direction; and deriving the beam peak direction of the AUT.
Public/Granted literature
- US20230258703A1 SYSTEM AND METHOD FOR PERFORMNG MEASUREMENTS OF ANTENNA UNDER TEST OFFSET FROM CENTER OF QUIET ZONE Public/Granted day:2023-08-17
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