公开(公告)号：US20240214080A1

公开(公告)日：2024-06-27

申请号：US18031835

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Thorsten Hertel ,  Zhu Wen ,  Li Cao

IPC: H04B17/10 ,  G01R29/10 ,  H04B17/11

CPC classification number: H04B17/102 ,  G01R29/10 ,  H04B17/11

Abstract: A method determines corrected TRP or TIS of an AUT in a near-field test chamber, the AUT having a phase center offset from a rotation center of the test chamber. The method includes performing EIRP or EIS measurements of the AUT at first sampling grid points on a first closed-surface geometric shape centered at the rotation center; mapping second sampling grid points to the first closed-surface geometric shape to provide mapped sampling grid points on the first closed-surface geometric shape, where the second sampling grid points are on a second closed-surface geometric shape centered at the phase center of the AUT; determining estimated EIRPs or EISs at the mapped sampling grid points using the EIRP or EIS measurements; scaling the estimated EIRPs or EISs at the mapped sampling grid points to provide scaled EIRPs or EISs; and calculating the corrected TRP or TIS based on the scaled EIRPs or EISs.

公开(公告)号：US20230258703A1

公开(公告)日：2023-08-17

申请号：US17059572

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Li Cao ,  Thorsten Hertel

IPC: G01R29/08 ,  G01R29/10

CPC classification number: G01R29/0892 ,  G01R29/105

Abstract: A system and method are provided to determine at least one of equivalent isotropic radiated power (EIRP) or effective isotropic sensitivity (EIS) of an antenna under test (AUT) in a test chamber, the AUT including an antenna array with an array phase center that is offset from a center of a quiet zone of the test chamber. The method includes performing a local beam peak direction scan of an antenna pattern of the AUT using a probe antenna located at laterally offset positions at a near-field distance from the AUT to determine a beam peak direction; performing EIRP and/or EIS near-field measurements of the AUT in the determined beam peak direction using the probe antenna located at near-field distances from the AUT in a radial direction; deriving a far-field equivalent of the EIRP and/or EIS near-field measurement along the determined beam peak direction; and deriving the beam peak direction of the AUT.

公开(公告)号：US12176961B2

公开(公告)日：2024-12-24

申请号：US18031835

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Thorsten Hertel ,  Zhu Wen ,  Li Cao

IPC: H04B17/10 ,  G01R29/10 ,  H04B17/11

Abstract: A method determines corrected TRP or TIS of an AUT in a near-field test chamber, the AUT having a phase center offset from a rotation center of the test chamber. The method includes performing EIRP or EIS measurements of the AUT at first sampling grid points on a first closed-surface geometric shape centered at the rotation center; mapping second sampling grid points to the first closed-surface geometric shape to provide mapped sampling grid points on the first closed-surface geometric shape, where the second sampling grid points are on a second closed-surface geometric shape centered at the phase center of the AUT; determining estimated EIRPs or EISs at the mapped sampling grid points using the EIRP or EIS measurements; scaling the estimated EIRPs or EISs at the mapped sampling grid points to provide scaled EIRPs or EISs; and calculating the corrected TRP or TIS based on the scaled EIRPs or EISs.

公开(公告)号：US20240110971A1

公开(公告)日：2024-04-04

申请号：US18220318

申请日：2023-07-11

Applicant: Keysight Technologies, Inc.

Inventor： Thorsten Hertel

IPC: G01R31/28 ,  H04W24/10

CPC classification number: G01R31/2822 ,  H04W24/10

Abstract: Methods, and systems of testing mobile devices in a four downlink (DL) manner are described. Among other improvements, the methods and systems of the present teaching provide a practical way to provide testing of DUTs that reduces not only the complexity of a test of the DUT, but also the time, required floor space/chamber height of the test system, and equipment that are needed to complete the testing to certain requirements, such as set by a standard.

公开(公告)号：US11879924B2

公开(公告)日：2024-01-23

申请号：US17059572

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Li Cao ,  Thorsten Hertel

IPC: G01R29/08 ,  G01R29/10

CPC classification number: G01R29/0892 ,  G01R29/0814 ,  G01R29/105

Abstract: A system and method are provided to determine at least one of equivalent isotropic radiated power (EIRP) or effective isotropic sensitivity (EIS) of an antenna under test (AUT) in a test chamber, the AUT including an antenna array with an array phase center that is offset from a center of a quiet zone of the test chamber. The method includes performing a local beam peak direction scan of an antenna pattern of the AUT using a probe antenna located at laterally offset positions at a near-field distance from the AUT to determine a beam peak direction; performing EIRP and/or EIS near-field measurements of the AUT in the determined beam peak direction using the probe antenna located at near-field distances from the AUT in a radial direction; deriving a far-field equivalent of the EIRP and/or EIS near-field measurement along the determined beam peak direction; and deriving the beam peak direction of the AUT.

公开(公告)号：US11251840B1

公开(公告)日：2022-02-15

申请号：US17107169

申请日：2020-11-30

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Li Cao ,  Thorsten Hertel

IPC: H04B3/46 ,  H04B7/0426 ,  G01R29/08 ,  H04B17/10

Abstract: A system and method are provided to determine equivalent isotropic radiated power (EIRP), effective isotropic sensitivity (EIS) and/or signal quality of a DUT in a test chamber, where the DUT has an AUT that has beam-forming capability and is offset from a center of a quiet zone of the test chamber. The method includes establishing a connection with the DUT using a far-field probe antenna in a far-field of the test chamber relative to the AUT so that the AUT forms a beam in a beam peak direction towards the far-field probe antenna; locking the beam of the AUT in the beam peak direction to prevent subsequent beam forming; and performing a near-field measurement of the EIRP, the EIS and/or the signal quality of the AUT with the beam locked in the beam peak direction using a near-field probe antenna in a near-field of the test chamber.