Invention Grant
- Patent Title: Platform measurement collection mechanism
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Application No.: US17733347Application Date: 2022-04-29
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Publication No.: US11886316B2Publication Date: 2024-01-30
- Inventor: Prashant Dewan , Uttam Sengupta , Aditya Katragada
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Jaffery Watson Mendonsa & Hamilton LLP
- Main IPC: G06F11/34
- IPC: G06F11/34 ; H04L9/32 ; H04L67/125

Abstract:
An apparatus to collect firmware measurement data at a computing system is disclosed. The apparatus includes a plurality of agents, each including a non-volatile memory storing firmware executed to perform a function associated with the agent, verification logic to generate measurement data by verifying the integrity of the firmware and a register to store the measurement data, and a processor to execute an instruction to collect firmware measurement data from each of the plurality of agents.
Public/Granted literature
- US20220253366A1 PLATFORM MEASUREMENT COLLECTION MECHANISM Public/Granted day:2022-08-11
Information query