• Patent Title: Device and method for checking for surface defect, using image sensor
  • Application No.: US17263818
    Application Date: 2019-06-26
  • Publication No.: US11892414B2
    Publication Date: 2024-02-06
  • Inventor: Young Yeop Yoon
  • Applicant: VIEW-ON LTD.
  • Applicant Address: KR Seoul
  • Assignee: VIEW-ON LTD.
  • Current Assignee: VIEW-ON LTD.
  • Current Assignee Address: KR Seoul
  • Agency: NKL Law
  • Agent Jae Youn Kim
  • Priority: KR 20180089808 2018.08.01
  • International Application: PCT/KR2019/007703 2019.06.26
  • International Announcement: WO2020/027440A 2020.02.06
  • Date entered country: 2021-01-27
  • Main IPC: G01N21/88
  • IPC: G01N21/88 G06T7/00
Device and method for checking for surface defect, using image sensor
Abstract:
Proposed are a device and method for checking for a surface defect, using an image sensor. The device can increase accuracy in detecting defects of various types, shapes, or directions, and include: a frame part for providing a transport path of an object to be checked, along the lengthwise direction parallel to the ground surface; a transport part provided on one side of the frame part so as to transport the object to be checked, along the transport path; and an image sensor part provided in the middle of the transport path so as to capture an image of the surface of the object to be checked, from above the transported object to be checked.
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