DEVICE AND METHOD FOR CHECKING FOR SURFACE DEFECT, USING IMAGE SENSOR

    公开(公告)号:US20210302324A1

    公开(公告)日:2021-09-30

    申请号:US17263818

    申请日:2019-06-26

    Applicant: VIEW-ON LTD.

    Inventor: Young Yeop YOON

    Abstract: Proposed are a device and method for checking for a surface defect, using an image sensor. The device can increase accuracy in detecting defects of various types, shapes, or directions, and include: a frame part for providing a transport path of an object to be checked, along the lengthwise direction parallel to the ground surface; a transport part provided on one side of the frame part so as to transport the object to be checked, along the transport path; and an image sensor part provided in the middle of the transport path so as to capture an image of the surface of the object to be checked, from above the transported object to be checked.

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