- 专利标题: Semiconductor structure and manufacturing method thereof
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申请号: US17467556申请日: 2021-09-07
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公开(公告)号: US11895821B2公开(公告)日: 2024-02-06
- 发明人: Jingwen Lu , Haihan Hung , Bingyu Zhu
- 申请人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 申请人地址: CN Hefei
- 专利权人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 当前专利权人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 当前专利权人地址: CN Hefei
- 代理机构: Cooper Legal Group, LLC
- 优先权: CN 2010685792.6 2020.07.16
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; H01L29/66 ; H10B12/00
摘要:
A semiconductor structure and a manufacturing method thereof are provided. The manufacturing method of the semiconductor structure includes: providing a substrate; forming on an upper surface of the substrate first patterns each including a first main body and a first flank wall covering a sidewall of the first main body; forming a filling layer which covers the first flank wall and fills a gap between adjacent first patterns; and etching a top of each of the first patterns to obtain second main bodies, second flank walls and protrusions located on upper surfaces of the second flank walls, the second flank wall covering a sidewall of the second main body, and a top of the protrusion being at least higher than a top of the second main body.
公开/授权文献
- US20220020749A1 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF 公开/授权日:2022-01-20
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