- Patent Title: Etching method for forming vertical structure, electronic device including vertical structure formed by the etching method, and method of manufacturing the electronic device
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Application No.: US17224254Application Date: 2021-04-07
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Publication No.: US11895922B2Publication Date: 2024-02-06
- Inventor: Choongho Rhee , Sungchan Kang , Yongseop Yoon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR 20200153081 2020.11.16
- Main IPC: H10N30/30
- IPC: H10N30/30 ; G01L1/16 ; H10N30/082

Abstract:
An etching method for forming a vertical structure is provided. The etching method may include: positioning a mask on a substrate, wherein the mask includes an opening pattern and a compensation pattern, and the compensation pattern is disposed at a corner of two adjacent sides of the opening pattern and includes a concave compensation pattern that is indented from one of the two adjacent sides; and forming the vertical structure on the substrate through the opening pattern of the mask by a dry etching process.
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