Invention Grant
- Patent Title: Display module inspection device and display module inspection method
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Application No.: US17464293Application Date: 2021-09-01
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Publication No.: US11906561B2Publication Date: 2024-02-20
- Inventor: Bongil Kang , Joo-Hyeon Jeong , Jun-Young Ko , Sangkook Kim , Gayeon Yun
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin-si
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-si
- Agency: F. CHAU & ASSOCIATES, LLC
- Priority: KR 20200185075 2020.12.28
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01R31/28 ; G09G3/00 ; H10K59/40

Abstract:
An inspection device inspects a display for defects. The display includes a power supply, a circuit board having a stabilizer to stabilize the power supply, a display panel which is electrically connected to the circuit board and has a first electrode, and an input sensor which is disposed on the display panel and has a second electrode. The inspection logic measures a value of capacitance between the first electrode and the second electrode of the display, and includes a frequency setter that sets a driving frequency of the second electrode to a frequency in a predetermined range.
Public/Granted literature
- US20220206049A1 DISPLAY MODULE INSPECTION DEVICE AND DISPLAY MODULE INSPECTION METHOD Public/Granted day:2022-06-30
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