Invention Grant
- Patent Title: X-ray ring markers for X-ray calibration
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Application No.: US17423921Application Date: 2020-03-25
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Publication No.: US11911207B2Publication Date: 2024-02-27
- Inventor: Alexandru Patriciu , Alyssa Torjesen , Molly Lara Flexman , Ashish Sattyavrat Panse , Marcin Arkadiusz Balicki , Ronaldus Frederik Johannes Holthuizen
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/EP2020/058278 2020.03.25
- International Announcement: WO2020/193598A 2020.10.01
- Date entered country: 2021-07-19
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/08

Abstract:
Various embodiments of the present disclosure include a C-arm registration system employing a controller (70) for registering a C-arm (60) to a X-ray ring marker (20). The X-ray ring marker (20) includes a coaxial construction of a chirp ring (40) and a centric ring (50) on an annular base (30). In operation, the controller (70) acquires a baseline X-ray image illustrative of the X-ray ring marker (20) within a baseline X-ray projection by the C-arm (60) at a baseline imaging pose, derives baseline position parameters of the X-ray ring marker (20) within the baseline X-ray projection as a function of an illustration of the centric ring (50) within the baseline X-ray image, and derives a baseline twist parameter of the X-ray ring marker (20) within the baseline X-ray projection as a function of the baseline position parameters and of an illustration of the chirp ring (40) within the baseline X-ray image.
Public/Granted literature
- US20220087633A1 X-RAY RING MARKERS FOR X-RAY CALIBRATION Public/Granted day:2022-03-24
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