- 专利标题: Selective symbol measurement for positioning
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申请号: US17467659申请日: 2021-09-07
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公开(公告)号: US11950210B2公开(公告)日: 2024-04-02
- 发明人: Alexandros Manolakos , Mukesh Kumar , Srinivas Yerramalli
- 申请人: QUALCOMM Incorporated
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM Incorporated
- 当前专利权人: QUALCOMM Incorporated
- 当前专利权人地址: US CA San Diego
- 代理机构: QUALCOMM Incorporated
- 主分类号: H04W72/02
- IPC分类号: H04W72/02 ; H04L5/00 ; H04W52/02 ; H04W72/04 ; H04W72/08 ; H04W72/51 ; H04W72/542
摘要:
A method of measuring a wireless OFDM PRS at a user equipment includes: selecting a symbol subset of a symbol group of the OFDM PRS, the OFDM PRS comprising a slot of symbols comprising the symbol group, the symbol group consisting of a first symbol quantity of consecutive ones of the symbols, the symbol group being fully staggered in frequency domain, the symbol subset consisting of a second symbol quantity of the symbols of the symbol group, the second symbol quantity being smaller than the first symbol quantity, and the symbol subset being less than fully staggered in the frequency domain; and measuring the symbol subset without measuring all of the symbols of the symbol group.
公开/授权文献
- US20220078759A1 SELECTIVE SYMBOL MEASUREMENT FOR POSITIONING 公开/授权日:2022-03-10
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