- 专利标题: Charged particle beam device and operation method therefor
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申请号: US17603225申请日: 2019-04-24
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公开(公告)号: US11961701B2公开(公告)日: 2024-04-16
- 发明人: Tomoharu Nagashima , Kazuki Ikeda , Wen Li , Masashi Wada , Hajime Kawano
- 申请人: Hitachi High-Tech Corporation
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECH CORPORATION
- 当前专利权人: HITACHI HIGH-TECH CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Volpe Koenig
- 国际申请: PCT/JP2019/017496 2019.04.24
- 国际公布: WO2020/217354A 2020.10.29
- 进入国家日期: 2021-10-12
- 主分类号: H01J37/22
- IPC分类号: H01J37/22 ; G06F3/04847 ; H01J37/28
摘要:
When adjusting optical axes of a multi-beam charged particle beam device, because parameters of optical systems are inter-dependent, the time required to adjust the parameters increases. Thus, the present invention provides a charged particle beam device provided with an optical parameter setting unit for setting parameters of optical systems for emitting a plurality of primary charged particle beams to a sample, detectors for individually detecting a plurality of secondary charged particle beams discharged from the sample, a plurality of memories for storing signals detected by the detectors and converted into digital pixels in the form of images, evaluation value derivation units for deriving evaluation values of the primary charged particle beams from the images, and a GUI capable of displaying the images and receiving an input from a user, wherein the GUI displays the images and evaluation results based on the evaluation values and changes various optical parameters in real-time.
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