Invention Grant
- Patent Title: Method and apparatus for measurement of TAI updates in an NTN
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Application No.: US17568669Application Date: 2022-01-04
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Publication No.: US11963125B2Publication Date: 2024-04-16
- Inventor: Kyeongin Jeong , Nishithkumar D. Tripathi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Main IPC: H04W60/04
- IPC: H04W60/04 ; G01S19/52 ; G01S19/53 ; H04W76/20 ; H04W84/06

Abstract:
Methods and apparatuses of UE for measurement of TAI updates in an NTN. A method of a UE comprises: receiving, from a BS, an SIB including multiple TAIs and an indication of whether to include a UE location in an NAS registration/tracking area update operation; determining whether to include the UE location based on the indication; identifying information for the UE location; generating a radio resource control (RRC) message including the information for the UE location, wherein the RRC message encapsulates a NAS message; and transmitting, to the BS, the RRC message including the information for the UE location.
Public/Granted literature
- US20220225265A1 METHOD AND APPARATUS FOR MEASUREMENT OF TAI UPDATES IN AN NTN Public/Granted day:2022-07-14
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