- 专利标题: Laterally-gated transistors and lateral Schottky diodes with integrated lateral field plate structures
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申请号: US17022521申请日: 2020-09-16
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公开(公告)号: US11967619B2公开(公告)日: 2024-04-23
- 发明人: Keisuke Shinohara , Casey King , Eric Regan , Miguel Urteaga
- 申请人: Teledyne Scientific & Imaging, LLC
- 申请人地址: US CA Thousand Oaks
- 专利权人: TELEDYNE SCIENTIFIC & IMAGING, LLC
- 当前专利权人: TELEDYNE SCIENTIFIC & IMAGING, LLC
- 当前专利权人地址: US CA Thousand Oaks
- 代理机构: K&L Gates LLP
- 主分类号: H01L29/40
- IPC分类号: H01L29/40 ; H01L29/778 ; H01L29/872
摘要:
Laterally-gated transistors and lateral Schottky diodes are disclosed. The FET includes a substrate, source and drain electrodes, channel, a gate electrode structure, and a dielectric layer. The gate electrode structure includes an electrode in contact with the channel and a lateral field plate adjacent to the electrode. The dielectric layer is disposed between the lateral field plate and the channel. The lateral field plate contacts the dielectric layer and to modulate an electric field proximal to the gate electrode proximal to the drain or source electrodes. Also disclosed is a gate electrode structure with lateral field plates symmetrically disposed relative to the gate electrode. Also disclosed in a substrate with dielectric structures buried in the substrate remote from the gate electrode structure. A lateral Schottky diode having an anode structure includes an anode (A), cathodes (C) and lateral field plates located between the anode and the cathodes.
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