Invention Grant
- Patent Title: Liveness test method and apparatus
-
Application No.: US17508001Application Date: 2021-10-22
-
Publication No.: US11971924B2Publication Date: 2024-04-30
- Inventor: Youngjun Kwak , Byung In Yoo , Youngsung Kim , Chang Kyu Choi , Jaejoon Han
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR 20170177240 2017.12.21
- The original application number of the division: US16224970 2018.12.19
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06F16/00 ; G06F16/583 ; G06F18/22 ; G06F18/2413 ; G06F21/32 ; G06F21/62 ; G06N3/02 ; G06V10/44 ; G06V10/764 ; G06V10/82 ; G06V40/16 ; G06V40/40 ; G06V40/50 ; G06N3/045 ; G06T7/60 ; G06T7/70

Abstract:
A processor-implemented liveness test method includes detecting a face region in a query image, the query image including a test object for a liveness test, determining a liveness test condition to be applied to the test object among at least one liveness test condition for at least one registered user registered in a registration database, determining at least one test region in the query image based on the detected face region and the determined liveness test condition, obtaining feature data of the test object from image data of the determined at least one test region using a neural network-based feature extractor, and determining a result of the liveness test based on the obtained feature data and registered feature data registered in the registration database and corresponding to the determined liveness test condition.
Information query