- 专利标题: Barrier structure for semiconductor device
-
申请号: US17871179申请日: 2022-07-22
-
公开(公告)号: US11996326B2公开(公告)日: 2024-05-28
- 发明人: Pin Chi Huang , Chien-Chang Fang , Rung Hung Hsueh
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Hauptman Ham, LLP
- 分案原申请号: US16554572 2019.08.28
- 主分类号: H01L21/768
- IPC分类号: H01L21/768 ; H01L21/02 ; H01L29/66 ; H01L29/78
摘要:
Methods for making semiconductor device having improve contact structures including the operations of depositing a first dielectric material, depositing a barrier material over the first dielectric material, depositing a second dielectric material over the barrier material, etching a two-slope contact opening with an upper sidewall angle of the opening through the second dielectric material that is less than a lower sidewall angle of the opening through the first dielectric material, and filling the two-slope contact opening with a conductive material, the conductive material.
公开/授权文献
- US20220359278A1 BARRIER STRUCTURE FOR SEMICONDUCTOR DEVICE 公开/授权日:2022-11-10
信息查询
IPC分类: