- 专利标题： Measuring method and measuring device
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申请号： US17459627申请日： 2021-08-27
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公开(公告)号： US12007363B2公开(公告)日： 2024-06-11
- 发明人: Takashi Usui , Kazuo Watabe
- 申请人： KABUSHIKI KAISHA TOSHIBA
- 申请人地址： JP Tokyo
- 专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人地址： JP Tokyo
- 代理机构： Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- 优先权： JP 20186553 2020.11.09
- 主分类号： G01N29/14
- IPC分类号： G01N29/14 ; G01N29/44
摘要：
A measuring method in an embodiment includes detecting elastic waves generated in a structural object formed of a solid material in a non-contact manner and estimating a position of an occurrence source of the elastic waves on the basis of information regarding an intensity of a signal of the detected elastic waves.
公开/授权文献
- US20220146457A1 MEASURING METHOD AND MEASURING DEVICE 公开/授权日：2022-05-12
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