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公开(公告)号：US12116513B2
公开(公告)日：2024-10-15
申请号：US17929431
申请日：2022-09-02
发明人： Takashi Usui , Tetsuya Kugimiya , Kazuo Watabe , Keisuke Ueno , Hidefumi Takamine , Junko Hirokawa , Yongfang Li , Yuki Ueda
IPC分类号： C09J9/02
CPC分类号： C09J9/02 , C09J2301/502
摘要： An adhesion/peeling method according to an embodiment includes adhering a first surface side of an electrically peelable adhesive sheet to a predetermined position of a fixation target object, wherein the electrically peelable adhesive sheet is formed of an electro-peeling adhesive having adhesiveness on the first surface side and a second surface side thereof, and the adhesiveness of the electro-peeling adhesive is lowered due to an input of a voltage; adhering a first electrode of an adherend including the first electrode formed of a conductor to the second surface side of the electrically peelable adhesive sheet; containing a liquid at the predetermined position of the fixation target object to temporarily form a second electrode with conductivity on a surface of the fixation target object; and inputting a predetermined voltage between the first electrode and the second electrode to peel of the electrically peelable adhesive sheet from the fixation target object.
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公开(公告)号：US12092582B2
公开(公告)日：2024-09-17
申请号：US17006935
申请日：2020-08-31
发明人： Hiroshi Ohno , Takashi Usui
CPC分类号： G01N21/8806 , G01B11/14 , G01B11/24 , G01N21/41 , G01N21/4133 , G01N21/47
摘要： An optical inspection device 1A includes a light selection unit 30, a detection element 40, and a first image formation element 20. The light selection unit 30 has the plurality of wavelength selection regions 32 that selectively transmits or reflects the light rays L of mutually different wavelength regions. The detection element 40 detects scattering characteristic information of the light rays L having reached the light receiving surface 41 via the light selection unit 30. The first image formation element 20 causes scattered light scattered by a subject S to enter a light receiving surface 41 via the light selection unit 30. The plurality of wavelength selection regions 32 has different azimuth angles with respect to the optical axis z of the first image formation element 20.
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公开(公告)号：US12038349B2
公开(公告)日：2024-07-16
申请号：US17463035
申请日：2021-08-31
发明人： Takashi Usui , Toshiki Takayasu , Kazuo Watabe , Atsuro Oonishi , Hiroshi Takahashi , Takamitsu Sunaoshi
IPC分类号： G01M17/10
CPC分类号： G01M17/10
摘要： According to one embodiment, an inspection system of an embodiment is an inspection system for inspecting a bogie including a plurality of side beams extending in a front-rear direction and disposed apart from each other in a left-right direction and a cross beam connecting the plurality of side beams. The inspection system includes one or more sensors and a position locator. The one or more sensors are installed on at least one of the plurality of side beams and the cross beam and detect elastic waves. The position locator identifies a beam in which the elastic waves have been generated or locates a position of an elastic wave source on the basis of the elastic waves detected by the one or more sensors.
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公开(公告)号：US11803094B2
公开(公告)日：2023-10-31
申请号：US16802828
申请日：2020-02-27
发明人： Hiroshi Ohno , Takashi Usui
IPC分类号： G02F1/29
CPC分类号： G02F1/29 , G02F2203/28
摘要： According to one example, an optical element assembly includes a transparent rod, a mirror and a light emitting element. The rod transmits light of first wavelength region made incident on a first end of the rod and emits the light of the first wavelength region from a second end of the rod. The rod absorbs light of a second wavelength region falling out of the first wavelength region. The mirror is disposed on a side of the first end. The mirror transmits one of the light of the first and second wavelength regions, reflects the other. The light of the first and second wavelength regions are made incident on the first end of the rod. The light emitting element emits light of the second wavelength region made incident on the first end of the rod through the mirror.
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公开(公告)号：US11754530B2
公开(公告)日：2023-09-12
申请号：US17184134
申请日：2021-02-24
发明人： Hidefumi Takamine , Yuki Ueda , Keisuke Ueno , Takashi Usui , Kazuo Watabe
IPC分类号： G01N29/07
CPC分类号： G01N29/07 , G01N2291/0289 , G01N2291/2698
摘要： According to one embodiment, a structure evaluation system includes a wave guide, a first sensor, a second sensor, and a calculation part. The wave guide is formed in a rod shape, is inserted into a hole that is formed at a predetermined depth from a surface of a measurement target, and has one end fixed to a deepest portion of the hole. The first sensor is provided at the other end of the wave guide at a position that is substantially the same as the surface. The second sensor is provided on the surface of the measurement target. The calculation part estimates a depth of damage occurring in the measurement target from the surface on the basis of a first detection value of an elastic wave transmitted to the measurement target which is detected by the first sensor through the wave guide and a second detection value obtained by an elastic wave which is detected by the second sensor.
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6.发明授权公开(公告)号：US11519883B2
公开(公告)日：2022-12-06
申请号：US17012604
申请日：2020-09-04
发明人： Sanae Iida , Takashi Usui
摘要： According to one embodiment, a structure evaluation system of the embodiments includes a plurality of sensors, an arrival time determiner, a reliability calculator, and a map generator. The plurality of sensors detect elastic waves. The arrival time determiner determines arrival times of the elastic waves using elastic waves detected by the plurality of respective sensors. The reliability calculator calculates reliabilities related to measurement waveforms of the elastic waves on the basis of the arrival times. The map generator generates a first map on the basis of the calculated reliabilities or the reliabilities and a distance.
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公开(公告)号：US20220146457A1
公开(公告)日：2022-05-12
申请号：US17459627
申请日：2021-08-27
发明人： Takashi Usui , Kazuo Watabe
摘要： A measuring method in an embodiment includes detecting elastic waves generated in a structural object formed of a solid material in a non-contact manner and estimating a position of an occurrence source of the elastic waves on the basis of information regarding an intensity of a signal of the detected elastic waves.
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公开(公告)号：US20200292505A1
公开(公告)日：2020-09-17
申请号：US16556286
申请日：2019-08-30
发明人： Yongfang Li , Takahiro Omori , Takashi Usui , Osamu Nishimura , Kazuo Watabe
IPC分类号： G01N29/42 , G01M13/028 , G01H11/08 , G01N29/12
摘要： According to one embodiment, a sensor module includes a sensor and a diagnosis circuit. The sensor includes piezoelectric transducers and switches. The piezoelectric transducers have different resonance frequencies. The switches are provided to correspond to the piezoelectric transducers, respectively. Each of the switches outputs an output signal corresponding to a voltage generated by an inverse piezoelectric effect of a corresponding piezoelectric transducer of the piezoelectric transducers. The diagnosis circuit diagnoses, based on a difference in pattern of the output signal, whether vibration has newly occurred in the sensor, and switch an output destination of the output signal of the sensor according to a result of the diagnosis.
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公开(公告)号：US10444197B2
公开(公告)日：2019-10-15
申请号：US16163706
申请日：2018-10-18
发明人： Takashi Usui , Kazuo Watabe
摘要： According to an embodiment, a detection system includes a plurality of first sensors, a second sensor, a first calculator, and a second calculator. Each of the first sensors is configured to detect an elastic wave generated from a structure, and convert the elastic wave into a detection signal. The second sensor is configured to detect a noise propagating from surroundings, and convert the noise into a reference signal. The first calculator is configured to calculate a plurality of difference detection signals based on the respective detection signals and the reference signal. The second calculator is configured to calculate a position of a generation source of the elastic wave from the plurality of difference detection signals.
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公开(公告)号：US12007363B2
公开(公告)日：2024-06-11
申请号：US17459627
申请日：2021-08-27
发明人： Takashi Usui , Kazuo Watabe
CPC分类号： G01N29/14 , G01N29/449 , G01N2291/0289
摘要： A measuring method in an embodiment includes detecting elastic waves generated in a structural object formed of a solid material in a non-contact manner and estimating a position of an occurrence source of the elastic waves on the basis of information regarding an intensity of a signal of the detected elastic waves.
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