- 专利标题: Portable nodal impedance analyser
-
申请号: US17891938申请日: 2022-08-19
-
公开(公告)号: US12007423B2公开(公告)日: 2024-06-11
- 发明人: S. R. Sabapathi , M. Pazhanivel
- 申请人: QMAX TEST EQUIPMENTS PVT. LTD.
- 申请人地址: IN Tamil Nadu
- 专利权人: QMAX TEST EQUIPMENTS PVT, LTD
- 当前专利权人: QMAX TEST EQUIPMENTS PVT, LTD
- 当前专利权人地址: IN Chennai
- 代理机构: GableGotwals
- 优先权: IN 2141039773 2021.09.02
- 主分类号: G01R27/16
- IPC分类号: G01R27/16 ; G01R31/28
摘要:
A portable nodal impedance analyser. The impedance analyser (100) is configured with an auto best curve-fit application which automatically selects the values for Voltage, Source Impedance and Frequency of the stimulus waveform (best fit values) to generate equivalent circuit and its appropriate V-I traces. The auto best curve-fit application automatically selects one or more input Sinusoidal Patterns (Waveforms) in such a way that the V-I Characteristics of the components present in a Node (the two points across which the input Pattern is driven, and response is received), are best revealed by automatically adjusting the Drive Voltage (0.2V, 4V, 8V and 13V), Source Impedance (10Ω, 50Ω, 100Ω, 500Ω, 1KΩ, 5KΩ, 10KΩ, 50KΩ, 100KΩ) and Frequency (from 1 Hz to 50 KHz) of the input Patterns.
公开/授权文献
- US20230080282A1 PORTABLE NODAL IMPEDANCE ANALYSER 公开/授权日:2023-03-16
信息查询