Invention Grant
- Patent Title: Trace microanalysis microscope systems and methods
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Application No.: US17778094Application Date: 2020-11-20
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Publication No.: US12025498B2Publication Date: 2024-07-02
- Inventor: Konstantinos Balas
- Applicant: SPECTRICON IKE
- Applicant Address: GR Chania
- Assignee: SPECTRICON IKE
- Current Assignee: SPECTRICON IKE
- Current Assignee Address: GR Chania
- Agency: DP IP GROUP
- Agent Franco S. De Liguori
- International Application: PCT/EP2020/082878 2020.11.20
- International Announcement: WO2021/099568A 2021.05.27
- Date entered country: 2022-05-19
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/02 ; G01J3/12 ; G01J4/04 ; G01N21/17 ; G01N21/21 ; G01N21/23 ; G01N21/31

Abstract:
The invention discloses a Trace Microanalysis Microscope System for high throughput screening. A multimodal imaging sensor arrangement acquires color, multispectral, hyperspectral and multi-directional polarized imaging, independently and in combinations thereof. In one aspect of this disclosure, the multimodal acquisition is combined with a plurality of sample illumination modes, further expanding the dimensionality of the generated data. In another aspect of this invention, machine learning-based methods combining and comparing a-priori data with the acquired multimodal data space, provide unique identifiers for the composition of the analyzed target objects. In yet another aspect of this invention, projection mapping of the identified compositional features navigates secondary sampling for subsequent analyses.
Public/Granted literature
- US20220412802A1 TRACE MICROANALYSIS MICROSCOPE SYSTEMS AND METHODS Public/Granted day:2022-12-29
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