- 专利标题: Temperature measurement circuit and temperature measurement device
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申请号: US17646028申请日: 2021-12-27
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公开(公告)号: US12025509B2公开(公告)日: 2024-07-02
- 发明人: Kohei Shibata
- 申请人: Kohei Shibata
- 申请人地址: JP Tokyo
- 专利权人: MITSUMI ELECTRIC CO., LTD.
- 当前专利权人: MITSUMI ELECTRIC CO., LTD.
- 当前专利权人地址: JP Tokyo
- 代理机构: IPUSA, PLLC
- 优先权: JP 21001307 2021.01.07
- 主分类号: G01K7/25
- IPC分类号: G01K7/25 ; G01K3/00
摘要:
A temperature measurement circuit for measuring a temperature using a temperature sensitive element includes a voltage control circuit configured to apply a control voltage to the temperature sensitive element. The temperature measurement circuit includes a first switching circuit configured to switch levels of the control voltage based on a current flowing through the temperature sensitive element. The temperature measurement circuit includes a conversion circuit configured to convert the current flowing through the temperature sensitive element into a voltage level corresponding to the measured temperature, by using predetermined conversion gain. The temperature measurement circuit includes a second switching circuit configured to switch values of the conversion gain based on the voltage level.
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