- Patent Title: Temperature measurement circuit and temperature measurement device
-
Application No.: US17646028Application Date: 2021-12-27
-
Publication No.: US12025509B2Publication Date: 2024-07-02
- Inventor: Kohei Shibata
- Applicant: Kohei Shibata
- Applicant Address: JP Tokyo
- Assignee: MITSUMI ELECTRIC CO., LTD.
- Current Assignee: MITSUMI ELECTRIC CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP 21001307 2021.01.07
- Main IPC: G01K7/25
- IPC: G01K7/25 ; G01K3/00

Abstract:
A temperature measurement circuit for measuring a temperature using a temperature sensitive element includes a voltage control circuit configured to apply a control voltage to the temperature sensitive element. The temperature measurement circuit includes a first switching circuit configured to switch levels of the control voltage based on a current flowing through the temperature sensitive element. The temperature measurement circuit includes a conversion circuit configured to convert the current flowing through the temperature sensitive element into a voltage level corresponding to the measured temperature, by using predetermined conversion gain. The temperature measurement circuit includes a second switching circuit configured to switch values of the conversion gain based on the voltage level.
Public/Granted literature
- US20220214228A1 TEMPERATURE MEASUREMENT CIRCUIT AND TEMPERATURE MEASUREMENT DEVICE Public/Granted day:2022-07-07
Information query